In time, the expansion of This system to an entire wafer, or much better, the use of a substantial resolution X-ray diffraction imaging (XRDI) method, to supply a complete 3D defect map with the Good Reduce layer will be handy to establish the defect density around The complete wafer. The https://www.facebook.com/permalink.php?story_fbid=pfbid02t5PjjArqP3gPPD1S5n8JHwaZEfNndEsPy9eGu73RNrHLmB7wxu7qmEiraP76ixvfl&id=61560512640678&__cft__[0]=AZWn3HyvOafh63eJ2nDvKcJyIW1z5KHvCQgJJTHSgYoA0uefOT4ooUmaTFW7mD1RVLYAEow_UW17A03TjYpPTyOcD0jq2eBd92YEP_uMHgx0iNNWDRbu4QGsY6sfsDsvtKQ4jqEr_OjlQfL3O59HZGwX3Gqp12O5AFF5aeMIAXZjuWk_YNpgzhUbQMAdCgzaJ-b9CHGNxErbt1TULb-uzf_M&__tn__=%2CO%2CP-R